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Scanning Microscopy for Nanotechnology

Techniques and Applications

€ 233.15

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials eng


Taal / Language : English

Inhoudsopgave:
1. Fundamentals of Scanning Electron Microscopy (SEM)
1
Weilie Zhou, Robert Apkarian, Zhong Lin Wang, and David Joy
1. Introduction
1
2. Configuration of Scanning Electron Microscopes
9
3. Sample Preparation
32
4. Summary
39
2. Backscattering Detector and EBSD in Nanomaterials Characterization
41
Tim Maitland and Scott Sitzman
1. Introduction
41
2. Data Measurement
51
3. Data Analysis
54
4. Applications
61
5. Current Limitations and Future
74
6. Conclusion
75
3. X-ray Microanalysis in Nanomaterials
76
Robert Anderhalt
1. Introduction
76
2. Monte Carlo Modeling of Nanomaterials
87
3. Case Studies
91
4. Summary
100
4. Low kV Scanning Electron Microscopy
101
M. David Frey
1. Introduction
101
2. Electron Generation and Accelerating Voltage
103
3. `Why Use Low kV?`
105
4. Using Low kV
112
5. Conclusion
119
5. E-beam Nanolithography Integrated with Scanning Electron Microscope
120
Joe Nabity, Lesely Anglin Compbell, Mo Zhu, and Weilie Zhou
1. Introduction
120
2. Materials and Processing Preparation
127
3. Pattern Generation
132
4. Pattern Processing
137
5. Applications
143
6. Summary
148
6. Scanning Transmission Electron Microscopy for Nanostructure Characterization
152
S.J. Pennycook, A.R. Lupini, M. Varela, A. Borisevich, Y. Peng, M.P. Oxley, K. Van Benthem, M.F. Chisholm
1. Introduction
152
2. Imaging in the STEM
155
3. Spectroscopic Imaging
173
4. Three-Dimensional Imaging
176
5. Recent Applications to Nanostructure Characterization
177
6. Future Directions
188
7. Introduction to In-Situ Nanomanipulation for Nanomaterials Engineering
192
Rishi Gupta and Richard E. Stallcup, II
1. Introduction
192
2. SEM Contamination
193
3. Types of Nanomanipulators
197
4. End Effectors
200
5. Applications of Nanomanipulators
205
6. Summary
223
8. Applications of FIB and DualBeam for Nanofabrication
225
Brandon Van Leer, Lucille A. Giannuzzi, and Paul Anzalone
1. Introduction
225
2. Onboard Digital Patterning with the Ion Beam
226
3. FIB Milling or CVD Deposition with Bitmap Files
230
4. Onboard Digital Patterning with the Electron Beam
231
5. Automation for Nanometer Control
233
6. Direct Fabrication of Nanoscale Structures
234
7. Summary
234
9. Nanowires and Carbon Nanotubes
237
Jianye Li and Jie Liu
1. Introduction
237
2. III-V Compound Semiconductors Nanowires
237
3. II-VI Compound Semiconductors Nanowires
250
4. Elemental Nanowires
260
5. Carbon Nanotubes
267
6. Conclusions
278
10. Photonic Crystals and Devices 281
Xudong Wang and Zhong Lin Wang
1. Introduction
281
2. SEM Imaging of Photonic Crystals
289
3. Fabrication of Photonic Crystals in SEM
298
4. Summary
302
11. Nanoparticles and Colloidal Self-assembly 306
Gabriel Caruntu, Daniela Caruntu, and Charles J. O`Connor
1. Introduction
306
2. Metal Nanoparticles
307
3. Mesoporous and Nanoporous Metal Nanostructures
322
4. Nanocrystalline Oxide
329
5. Nanostructured Semiconductor and Thermoelectric Materials
347
6. Conclusions
353
12. Nano-building Blocks Fabricated through Templates 357
Feng Li and John B. Wiley
1. Introduction
357
2. Materials and Methods
358
3. Nano-Building Blocks
361
4. Conclusions
380
13. One-dimensional Wurtzite Semiconducting Nanostructures 384
Pu Xian Gao and Zhong Lin Wang
1. Introduction
384
2. Synthesis and Fabrication of 1D Nanostructures
384
3. One-Dimensional Metal Oxide Nanostructures
389
4. Growth Mechanisms
414
5. Summary
423
14. Bio-inspired Nanomaterials 427
Peng Wang, Guobao Wet Xiaohua Liu, and Peter X. Ma
1. Introduction
427
2. Nanofibers
429
3. Nanoparticles
444
4. Surface Modification
455
5. Summary
462
15. Cryo-Temperature Stages in Nanostructural Research 467
Robert P. Apkarian
1. Introduction
467
2. Terminology Used in Cryo-HRSEM of Aqueous Systems
468
3. Liquid Water, Ice, and Vitrified Water
469
4. History of Low Temperature SEM
472
5. Instrumentation and Methods
473
Author Index 491
Subject Index 513
Extra informatie: 
Hardback
552 pagina's
Januari 2006
1053 gram
245 x 162 x 27 mm
Springer New York us

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