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Kalinin, Sergei

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Fundamentals and Applications

€ 498.25

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical intro


Taal / Language : English

Inhoudsopgave:
List of Contributors
ix
About the Editors xix
Introduction: Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization 1(8)
S. V. Kalinin
A. Gruverman
Part I. SPM Techniques for Electrical Characterization
9(338)
Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
11(20)
A. P. Baddorf
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
31(57)
P. Eyben
W. Vandervorst
D. Alvarez
M. Xu
M. Fouchier
Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
88(25)
J. J. Kopanski
Principles of Kelvin Probe Force Microscopy
113(19)
Th. Glatzel
M.Ch. Lux-Steiner
E. Strassburg
A. Boag
Y. Rosenwaks
Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
132(41)
Ryan O`Hayre
Minhwan Lee
Fritz B. Prinz
Sergei V. Kalinin
Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
173(42)
A. L. Kholkin
S. V. Kalinin
A. Roelofs
A. Gruverman
Principles of Near-Field Microwave Microscopy
215(39)
Steven M. Anlage
Vladimir V. Talanov
Andrew R. Schwartz
Electromagnetic Singularities and Resonances in Near-Field Optical Probes
254(26)
Alexandre Bouhelier
Renaud Bachelot
Electrochemical SPM: Fundamentals and Applications
280(35)
T. J. Smith
K. J. Stevenson
Near-Field High-Frequency Probing
315(32)
C. A. Paulson
D. W. van der Weide
Part II. Electrical and Electromechanical Imaging at the Limits of Resolution
347(212)
Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors
349(23)
Markus Morgenstern
Spin-Polarized Scanning Tunneling Microscopy
372(23)
Wulf Wulfhekel
Uta Schlickum
Jurgen Kirschner
Scanning Probe Measurements of Electron Transport in Molecules
395(28)
Kevin F. Kelly
Paul S. Weiss
Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
423(17)
C. Staii
M. Radosavljevic
A. T. Johnson
Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
440(15)
M. Stadermann
S. Washburn
Theory of Scanning Probe Microscopy
455(25)
Vincent Meunier
Philippe Lambin
Multi-Probe Scanning Tunneling Microscopy
480(26)
Shuji Hasegawa
Dynamic Force Microscopy and Spectroscopy in Vacuum
506(28)
Udo D. Schwarz
Hendrik Holscher
Scanning Tunneling Microscopy and Spectroscopy of Manganites
534(25)
Christoph Renner
Henrik M. Ronnow
Part III. Electrical SPM Characterization of Materials and Devices
559(272)
Scanning Voltage Microscopy: Investigating the Inner Workings of Optoelectronic Devices
561(40)
Scott B. Kuntze
Dayan Ban
Edward H. Sargent
St. John Dixon-Warren
J. Kenton White
Karin Hinzer
Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
601(14)
Ida Lee
Elias Greenbaum
Electromechanical Behavior in Biological Systems at the Nanoscale
615(19)
A. Gruverman
B. J. Rodriguez
S. V. Kalinin
Scanning Capacitance Microscopy: Applications in Failure Analysis, Active Device Imaging, and Radiation Effects
634(29)
C. Y. Nakakura
P. Tangyunyong
M. L. Anderson
Kelvin Probe Force Microscopy of Semiconductors
663(27)
Y. Rosenwaks
S. Saraf
O. Tal
A. Schwarzman
Th. Glatzel
M. Ch. Lux-Steiner
Nanoscale Characterization of Electronic and Electrical Properties of Ill-Nitrides by Scanning Probe Microscopy
690(25)
B. J. Rodriguez
A. Gruverman
R. J. Nemanich
Electron Flow Through Molecular Structures
715(31)
Sidney R. Cohen
Electrical Characterization of Perovskite Nanostructures by SPM
746(30)
K. Szot
B. Reichenberg
F. Peter
R. Waser
S. Tiedke
SPM Measurements of Electric Properties of Organic Molecules
776(12)
Takao Ishida
Wataru Mizutani
Yasuhisa Naitoh
Hiroshi Tokumoto
High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
788(43)
William R. Silveira
Erik M. Muller
Tse Nga Ng
David H. Dunlap
John A. Marohn
Part IV. Electrical Nanofabrication
831(112)
Electrical SPM-Based Nanofabrication Techniques
833(25)
Nicola Naujoks
Patrick Mesquida
Andreas Stemmer
Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
858(22)
J. A. Dagata
UHV-STM Nanofabrication on Silicon
880(26)
Peter M. Albrecht
Laura B. Ruppalt
Joseph W. Lyding
Ferroelectric Lithography
906(23)
Dongbo Li
Dawn A. Bonnell
Patterned Self-Assembled Monolayers via Scanning Probe Lithography
929(14)
James A. Williams
Matthew S. Lewis
Christopher B. Gorman
Resistive Probe Storage: Read/Write Mechanism
943(1)
Seungbum Hong
Noyeol Park
Index
Extra informatie: 
Hardback
980 pagina's
Januari 2006
1973 gram
241 x 165 x 51 mm
SPRINGER PG us

Levertijd: 5 tot 11 werkdagen