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Chim, Wai Kin

Semiconductor Device and Failure Analysis

Using Photon Emission Microscopy

€ 259.95

The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures.


Taal / Language : English

Inhoudsopgave:
Preface.

Introduction.

Theory of Light Emission in Semiconductors.

Instrumentation Aspects of the Photon Emission Microscope.

Backside Photon Emission Microscopy.

Spectroscopic Photon Emission Microscopy.

Photon Emission from Metal Oxide Semiconductor Field Effect Transistors under Hot Carrier Stressing.

Photon Emission from Metal Oxide Semiconductor Field Effect Transistors under High Field Impulse Stressing.

Oxide Degradation and Photon Emission from Metal Oxide Semiconductor Capacitor Structures.

Index.
Extra informatie: 
Hardback
288 pagina's
530 gram
236 x 157 x 20 mm
Wiley-Blackwell us

Levertijd: 5 tot 11 werkdagen