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Brewer, Joe

Nonvolatile Memory Technologies with Emphasis on Flash

A Comprehensive Guide to Understanding and Using Flash Memory Devices

€ 223.95

Nonvolatile Memory Technologies with Emphasis on Flash (NMT) provides a detailed view of the integrated circuit main line technologies; the book gives an introduction to technologies that have less manufacturing exposure, and presents a description of various possible alternative technologies that may emerge in the future.


Taal / Language : English

Inhoudsopgave:
Foreword xvii
Preface xxi
Contributors xxiii
Introduction to Nonvolatile Memory
1(18)
Joe E. Brewer
Introduction
1(1)
Elementary Memory Concepts
2(7)
Unique Aspects of Nonvolatile Memory
9(4)
Storage
9(3)
Storage Mechanisms
12(1)
Retention
12(1)
Endurance
13(1)
Flash Memory and Flash Cell Variations
13(3)
Semiconductor Device Technology Generations
16(3)
References
18(1)
Flash Memory Applications
19(44)
Gary Forni
Collin Ong
Christine Rice
Ken McKee
Ronald J. Bauer
Introduction
19(19)
Spectrum of Memory Devices
20(1)
Evolving from EPROMs
21(1)
NOR and NAND
22(1)
Evolution of Flash Usage Models
23(2)
Understanding Flash Attributes
25(13)
Code Storage
38(8)
Execute-in-Place
39(4)
Store and Download
43(2)
Contrasting Execute-in-Place Versus Store and Download
45(1)
Future Code Storage Applications
45(1)
Data Storage
46(8)
Why Use Flash to Store Data?
46(1)
Architectural Decisions
46(3)
Embedded Flash Storage
49(1)
Removable Media
50(4)
Code+Data Storage
54(8)
Relevant Attributes for Code+Data
55(3)
Fitting the Pieces Together for Code+Data
58(3)
Benefits of Code+Data
61(1)
Conclusion
62(1)
Memory Circuit Technologies
63(66)
Giulio G. Marotta
Giovanni Naso
Giuseppe Savarese
Introduction
63(1)
Flash Cell Basic Operation
63(3)
Cell Programming
64(1)
Cell Erase
64(1)
Compaction
65(1)
Read
65(1)
Flash Memory Architecture
66(9)
Memory Cell Array
69(2)
Analog Blocks
71(2)
Control Logic
73(2)
Redundancy
75(12)
Defectivity and Process Variations
75(1)
Yield Improvement
75(2)
Yield Simulator
77(1)
Redundancy Fuses Design
78(1)
Row Redundancy Design
79(1)
Column Redundancy Design
80(1)
Advanced Redundancy Design
81(6)
Error Correction Coding (ECC)
87(2)
On-Chip ECC and Endurance/Retention in Flash Memories
88(1)
On-Chip ECC and Multilevel Flash Memories
89(1)
Design for Testability (DFT)
89(19)
Test Entry and Organization
91(1)
Fuse Cell
92(1)
Sense Amplifier Reference Trimming and Monitor
93(1)
High Voltages Trimming
94(2)
Timings Trimming and External Control
96(1)
Internal State Machine Algorithm Skips and Monitor
97(1)
Address Path Configuration
98(1)
Data Path Configuration and Trimming
99(2)
High Voltages External Forcing and Monitor
101(2)
Array Direct Access and Stresses
103(2)
Internal Pattern Write and Verify
105(1)
Data Compression
106(2)
Flash-Specific Circuit Techniques
108(21)
Voltage Level Shifting
109(3)
Sensing
112(2)
Voltage Multiplication
114(4)
Reference Voltage Generation
118(1)
Voltage Regulation
119(3)
I/O Signal Buffering
122(1)
References
123(6)
Physics of Flash Memories
129(50)
J. Van Houdt
R. Degraeve
G. Groeseneken
H. E. Maes
Introduction
129(1)
Basic Operating Principles and Memory Characteristics
130(13)
Floating-Gate Principle
130(1)
Basic Definitions with Examples
Extra informatie: 
Hardback
792 pagina's
Januari 2008
1433 gram
260 x 184 x 44 mm
Wiley-Blackwell us

Levertijd: 5 tot 11 werkdagen